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Fangzhou Xia, Kamal Youcef-Toumi, Ivo W. Rangelow

Active Probe Atomic Force Microscopy

From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatr…

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EUR 69,33* Aktueller Preis: EUR 69,33

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