Seong H Kim: Surface and Interface Analysis, Kartoniert / Broschiert

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Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces
Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schrödinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to translate theoretical knowledge into applied skills through a Maieutic pedagogical approach.
Written by a highly qualified professor, Surface and Interface Analysis: Fundamental Principles includes information on:
Relationship between surface energy and the Gibbs free energy equation and surface characterization techniques that work in an ultra-high vacuum
Measurement of binding energy of photoelectrons and relaxation processes that can occur upon or during the photoelectron emission process
Governance of energy level of the valence band and what can be learned from analyzing the valence band with XPS
Improvement of depth resolution in sputter profiling and artifacts that may be encountered during sputter depth profiling

Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.