Pedro Alberto Oliveira Paiva: Analog Integrated Circuit Design Under PVT Conditions, Kartoniert / Broschiert

Klappentext

This book delivers a focused, technical exploration of automated analog and RF integrated circuit sizing under process, voltage, and temperature variations, guiding readers through foundational concepts, current methodologies, and advanced machinelearningdriven approaches. It first examines multiple reinforcementlearningbased strategies for embedding PVT conditions directly into modern sizing flows, clarifying their conceptual differences and practical implications. It then explores a complementary deeplearningassisted approach that leverages ANNbased performance regressors, transfer learning, and adaptive refinement to accelerate simulationdriven optimization without requiring extensive cornerspecific datasets. Together, these chapters provide a grounded overview of current techniques and ongoing developments in automated analog IC design.